Tew HY, Ismail A. Comparative Analysis of Hot Face and Internal Insulators using X-Ray Diffraction (XRD): Element & Compound Analysis for Thermal Applications. Semarak Int. J. Mater. Res. [Internet]. 2025 Jun. 30 [cited 2025 Jul. 20];3(1):9-20. Available from: https://semarakilmu.my/index.php/sijmr/article/view/531