TEW, Heng Yao; ISMAIL, Azzura. Comparative Analysis of Hot Face and Internal Insulators using X-Ray Diffraction (XRD): Element & Compound Analysis for Thermal Applications. Semarak International Journal of Material Research, [S. l.], v. 3, n. 1, p. 9–20, 2025. DOI: 10.37934/sijmr.3.1.920. Disponível em: https://semarakilmu.my/index.php/sijmr/article/view/531. Acesso em: 20 jul. 2025.