Tew, H.Y. and Ismail, A. 2025. Comparative Analysis of Hot Face and Internal Insulators using X-Ray Diffraction (XRD): Element & Compound Analysis for Thermal Applications. Semarak International Journal of Material Research. 3, 1 (Jun. 2025), 9–20. DOI:https://doi.org/10.37934/sijmr.3.1.920.